Energy Loss Spectroscopy

Beamline ELS is mainly dedicated towards studying, describing and predicting energy loss spectroscopies, such as Electron Energy Loss (EELS) and inelastic x-ray scattering (IXS).

EELS and IXS are two very different (electron microscope for EELS; synchrotron radiation for IXS) and yet complementary experimental techniques, in many respects. Energy, momentum, and spatial resolution are different for the two techniques, for instance. However, both EELS and IXS measure the same quantity, the dynamical structure factor $S(\mathbf{q},\omega)$. This quantity is related to the inverse dielectric function \[ \varepsilon^{-1}(\mathbf{q},\omega), \] which is the quantity that is actually calculated via ab initio techniques, such as TDDFT or BSE.

What

• Electron Energy Loss Spectroscopy (EELS).
• Reflection Electron Energy Loss Spectroscopy (REELS).
• Inelastic and Coherent X-ray Scattering (IXRS,CIXS).

Where

• Bulk, Surfaces and Nanostructures.

How

• Density functional approach: DFT-KS, TDDFT.
• Many-body techniques: Bethe-Salpeter Equation.

Beamline Coordinator

Dr. Francesco Sottile

Ecole Polytechnique, Palaiseau, France
francesco [dot] sottile [at] polytechnique [dot] edu

References

• Excitonic Effects on the Silicon Plasmon Resonance ,
  V. Olevano and L. Reining, Phys. Rev. Lett. 86, 5962 (2001).
• Ab initio calculation of many-body effects on the EEL spectrum of the C(100) surface,
  Maurizia Palummo, Olivia Pulci, Andrea Marini, Lucia Reining, and Rodolfo Del Sole, Phys. Rev. B 74, 235431 (2006).
• Signatures of Short-Range Many-Body Effects in the Dielectric Function of Silicon for Finite Momentum Transfer ,
  Hans-Christian Weissker, Jorge Serrano, Simo Huotari, Fabien Bruneval, Francesco Sottile, Giulio Monaco, Michael Krisch, Valerio Olevano, and Lucia Reining, Phys. Rev. Lett. 97, 237602 (2006).
• Adsorption of molecular oxygen on GaAs(001) studied using high-resolution electron energy-loss spectroscopy,
  E. Placidi, C. Hogan, F. Arciprete, M. Fanfoni, F. Patella, R. Del Sole, and A. Balzarotti, Phys. Rev. B 73, 205345 (2006).